products

products categories

Download

Download Download file and products catalogue for equipment.

contact us

  • If you have questions, please contact us, all questions will be answered
  • Tel : +86 18030236818
  • Fax : +86-592 5237901
  • Email : dexing@china-dexing.com

hot products

  • DX-100 Hall Effect Measurement System

  • DX-2012HC soft magnetic material coercivity measuring device

  • DX-330F 3D Fluxgate Magnetometer

  • DX-105 Gauss Meter

  • DXSB Double-Yoke Double-Tuning Adjustable Air Gap Electromagnet

  • 3 Axis Helmholtz Coils

T80/T81 High and low temperature vacuum probe station

It can be tested at high and low temperature (4.2k-500k) in vacuum environment. It can be upgraded to load magnetic field and low temperature radiation screen design. The sample stand is made of high purity oxygen free copper, and the temperature uniformity is better. The temperature sensor adopts PT100 with good stability and repeatability or calibrated silicon diode as the temperature measuring

contact now

T80/T81 High and low temperature vacuum probe station


Introduction:

It can be tested at high and low temperature (4.2k-500k) in vacuum environment. It can be upgraded to load magnetic field and low temperature radiation screen design. The sample stand is made of high purity oxygen free copper, and the temperature uniformity is better. The temperature sensor adopts PT100 with good stability and repeatability or calibrated silicon diode as the temperature measuring device, which supports the optical fiber spectral characteristic test, Compatible with high magnification metallographic microscope, it can fine tune the movement, high frequency characteristics of the device (support the highest 67ghz frequency), probe heat sink design, light intensity / wavelength test of ld/led/pd, automatic flow control, iv/cv characteristic test of materials / devices, etc.


Parameter:

Model

T81-50Probe table

T80-50Probe table

Refrigeration mode

Liquid helium / liquid nitrogen refrigeration

Closed cycle refrigerator

Cavity material

Non magnetic stainless steel or aluminum alloy

temperature range

4.2k-450k

5k-450k

Cooling time

40min

About 150min

Flatness of sample table

≤7μm

Magnification

16~100X/20~ 4000X

Power demand

220V 50-60Hz

Note:

※The maximum need to measure a few inches of wafers or devices! Do you need to test fragments or single chips! The smallest single chip size!

※How high is the mechanical precision requirement of the probe station!

※Point to measure the electrode size of the sample! 100μm *100μm or 60μm *60μm pad, or mini pad made by FIB, or metal circuit inside ic!

※At most, several probes are needed to measure at the same time!

※Whether the probe card test will be used!

※How much do you need to use the minimum resolution of an optical microscope!

※For the microscope, do you need to add a polarizer for LC liquid crystal hot spot detection!

※During the probe point measurement, whether the current requirement reaches 100fa or below! Low

Is the capacitance requirement to be 0.1pf! Is there RF demand!

※What are the test instrument interfaces connected!

※Whether heating or cooling is needed when testing the environment! Do you need to seal the cavity!

※How about the leakage requirements of chuck! Do you need to add low impedance chuck!

※Do you need a shockproof table!

※If an anti-vibration table is added, is there compressed air


inquiry now

    We will give you a quotation within 24 hours.

    Contact Us:

    Company:    DEXING MAGNET TECH. CO., LIMITED.

    Tel:    +86 18030236818
    Email:    dexing@china-dexing.com
Main Products
  • DX-2012HC Soft Magnetic Material Coercivity Measuring Device

    DX 2012HC soft magnetic material coercivity measuring device is mainly used for rapid measurement of soft materials including: pure iron and carbon steel, soft ferrite, magnetic powder and other regular and irregular open circuit samples, and the test method is reliable.

  • DX-100 Hall Effect Measurement System

    DX 100 Hall effect test system can be divided into normal temperature, high temperature, low temperature, high and low temperature Hall effect test system; It is used to measure the carrier concentration, mobility, resistivity, Hall coefficient, etc. of semiconductor materials; It is an essential tool for studying the electrical properties of semiconductor materials.

  • DX-9000 Series Vibration Sample Magnetometer

    DX-9000 series vibrating sample magnetometer is a kind of magnetometer developed by Xiamen Dexing Magnet Tech. Co., Ltd. The main research and development of the magnetic material measurement system is a new generation of products based on the electromagnet platform.

  •  DX-2100AM Magnetization Angle Measurement System

    The DX 2100AM magnetization angle measurement system is connected to the independent three component fluxmeter by a three dimensional Helmholtz coil to form a hardware test part;Through a microcomputer conversion of the test data of three components, a complete magnetization angle measurement system is formed.