Hall Effect Measurement System
Hall effect measurement system for measuring the carrier concentration, mobility of semiconductor materials, resistivity, hall coefficient and other important parameters, and these parameters is the understanding of semiconductor materials electrical characteristics must be controlled in advance, so the hall effect tester is understanding and studying the characteristics of semiconductor devices and semiconductor materials electrical essential tools.
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DX-30 Permanent Magnet Hall Effect Test System
The experimental results are automatically calculated by the software, and the Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient (Hall) can be obtained at the same time. Coefficient), magnetoresistance (Magnetoresistance) and so on.
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DX-50 Hall Effect Measurement System
DX 50 Hall Effect Measurement System is an essential tool to understand and study of semiconductor devices and electrical properties of semiconductor materials. It will get Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient, Magneto resistance, I V curve and I-R curve measurement parameters
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DX-60 Hall Effect Test System
This instrument system consists of electromagnet, electromagnet power supply, high-precision constant current source, high-precision voltmeter, Hall effect sample holder, standard sample, and system software. The DX-320 effector specially developed for this instrument system integrates a constant current source.
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DX-80 Normal Temperature Hall Effect Test System
The instrument system is composed of electromagnet, electromagnet power supply, high-precision constant current source, high-precision voltmeter, Hall effect sample holder, standard sample, and system software. The CH-320 effector specially developed for this instrument system integrates a constant current source
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DX-99 Fast Hall Effect Measurement System
DX-99 Fast Hall measuring instrument is a fast measuring system developed based on electric transport property measurement system. It adopts integrated structure design, has the characteristics of small volume, fast speed, convenient sample change, one-key test, and is equipped with replaceable low-temperature options, so that the measurement is more convenient and fast.
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DX-100 Hall Effect Measurement System
DX 100 Hall effect test system can be divided into normal temperature, high temperature, low temperature, high and low temperature Hall effect test system; It is used to measure the carrier concentration, mobility, resistivity, Hall coefficient, etc. of semiconductor materials; It is an essential tool for studying the electrical properties of semiconductor materials.
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DX-3000 Hall Effect Measurement System
The DX 3000 Hall Effect Test System is a fully automated test system that combines Hall effect, magnetoresistance, and I-V characteristics. The magnetic field is equipped with electromagnet or liquid-free superconducting magnet according to the user's needs. It is a powerful tool for researchers to study the electrical transport properties of samples.
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Dx-1000 Hall Effect Meter
Hall effect tester is used to measure the carrier concentration, mobility, resistivity, Hall coefficient and other important parameters of semiconductor materials, and these parameters are to understand the electrical characteristics of semiconductor materials must be controlled in advance
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