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hot products

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    DX-330F 3D Fluxgate Magnetometer

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  • 3 Axis Helmholtz Coils

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Products

DX-60 Hall Effect Test System

This instrument system consists of electromagnet, electromagnet power supply, high-precision constant current source, high-precision voltmeter, Hall effect sample holder, standard sample, and system software. The DX-320 effector specially developed for this instrument system integrates a constant current source.

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DX-60 Hall Effect Test System


     This instrument system consists of electromagnet, electromagnet power supply, high-precision constant current source, high-precision voltmeter, Hall effect sample holder, standard sample, and system software. The DX-320 effector specially developed for this instrument system integrates a constant current source, a six-and-a-half-digit microvoltmeter and a complex switching relay-switch for Hall measurement into a whole, which greatly reduces the connection and operation of the experiment. DX-320 can be used as a constant current source and a microvoltmeter alone. It is used to measure important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials. These parameters must be controlled in advance to understand the electrical characteristics of semiconductor materials. Therefore, the Hall effect test system is to understand and study semiconductor devices. And a necessary tool for the electrical properties of semiconductor materials. The experimental results are automatically calculated by the software, and the Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient (Hall) can be obtained at the same time. Coefficient), magnetoresistance (Magnetoresistance) and so on.


Testable materials

Physical parameters

Carrier Density

103cm-3  1023cm-3

Mobility

0.1cm2/volt*sec 108cm2/volt*sec

Resistivity

10-7 Ohm*cm1012 Ohm*cm

Hall voltage

1uV ~ 3V

Hall index

10-5  1027cm3/C

Testable material type

semiconductors

SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe and ferrite materials, etc.

Low impedance material

Graphene, metal, transparent oxide,

Weak magnetic semiconductor materials, TMR materials, etc.

High-impedance material

Semi-insulating GaAs, GaN, CdTe, etc.

Material conductive particles

P-type and N-type testing of materials

Magnetic field environment

Magnet type

Variable electromagnet

Magnetic field size

1070mT (The distance between the poles: 10mm)

678mT (The distance between the poles: 20mm)

500mT (The distance between the poles: 30mm)

378mT (The distance between the poles: 40mm)

293mT (The distance between the poles is 50mm)

Uniform zone

1%

Optional magnetic environment

Electromagnets with relevant magnetic sizes can be customized according to customer needs

Electrical parameters

Battery

50.00nA-50.00mA

Current source resolution

0.0001uA

Measuring voltage

0±3V

Voltage measurement resolution

0.0001mV

Temperature environment

Room temperature/liquid nitrogen temperature

Other Accessories

Shading

Externally install shading parts to make the test material more stable

Sample size

Maximum 10mm*10mm

Test sample

Provide Hall Effect from Institute of Semiconductors, Chinese Academy of Sciences

Standard test samples and data: 1 set

(Silicon, germanium, gallium arsenide, indium antimonide)

Making ohmic contacts

Electric soldering iron, indium sheet, solder, enameled wire, etc.


Sample test sample

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Instrument introduction

Item No.

Name

Technical Specification

001

DX-50

Electromagnet

1. Magnetic field intensity (Magnet Flux Density)

The maximum magnetic field is 1070mT when the distance between N and S is 10mm

The maximum magnetic field is 678mT when the distance between N and S is 20mm

The maximum magnetic field is 500mT when the distance between N and S is 30mm

Maximum magnetic field 378mT when the distance between N and S is 40mm

Maximum magnetic field 293mT when N, S spacing is 50mm

2. Uniformity of magnetic field: when the gap is 10mm, the uniformity of the diameter of 10mm is 1%

3. Electromagnet parameters

3.1, pole diameter φ: 50mm

3.2. Diameter of the pole φ: 50mm

3.3. Adjustable range of pole head gap: 0 ~ 80mm

3.4. The internal resistance of the coil: about 12.0Ω

3.5. Magnetic field stability: ±0.3Gs (within 24h)

3.6 Self-weight: 30Kg

002

DX-2031

A constant current source

1. Output voltage: effective output voltage range 0V60V DC, open circuit output voltage: 80V 5V @5A

2. Output current: -5A ~ +5A DC (the current linear gradient rate is 0.01A/s-2A/s continuous optional, the maximum scanning current setting range is 0.1mA-5A DC)

3. High step resolution 0.1mA (1/50000 F.S.)

4. Accuracy (0.2% setting value + 5mA), stability better than 0.1% @5A

5. Noise/ripple: 5mA RMS typical value @5A

6. The RS-232 interface can be digitally controlled polarity conversion, which is convenient for the automated Hall effect test process

7. Interactive ability: White backlit FSTN LCD display, necessary LED status indicator, 34-key interactive function keyboard operation with display and indicator, standard RS-232C computer interface and easy-to-use interface features, complete Computer interface command set, timing and continuous trigger output function during scanning

8. Load protection function: instrument power-off protection, instrument over-temperature protection, instrument over-current protection, instrument over-power protection

003

DX-1300

Gauss meter

1. Range: ±1Gs ~ ±30kGs

2. Resolution: 1Gs

3. Accuracy: ±0.5%±0.05% of reading range

4. The thickness of the magnetic sensor is 1.0mm and the length is 100mm

5. Human-computer interaction: bright widescreen high-definition LCD screen, 4¾-digit display, standard 9-pin "D" type RS232 connector

6. Automation: complete computer instructions, through data communication, real-time monitoring and control of the magnetic field environment around the test sample on the computer interface

004

DX-320

Sample constant current source

1. The basic resolution of current output is 0.0001uA, and the basic resolution of voltage measurement is 0.0001mV

2. Output range: 50.00nA-50.00mA can be continuously adjustable in steps of 0.1nA

3. Measuring voltage: 0~±3V large range test voltage meets the test of high resistance chip

4. Built-in four-phase array card with automatic conversion, which can realize automatic measurement of Hall effect van der Pauw method

5. Good human-computer interaction interface, convenient for users to make manual adjustments

6. Complete host computer instructions, which can communicate with the computer to complete various operations

005

DX-35

Sample stage

1. The sample table can support 30*30mm size samples for testing

2. The pressure point of the four-probe method makes the operation and the contact of the sample more convenient and firm

3. The shading parts are installed outside to make the test material more stable

4. The sample stage is fixed on the permanent magnet bracket, so that the sample is in the same position each time, ensuring better measurement repeatability

5. The pin of the sample stage is connected with the CH-320 instrument through the wire to realize the stable measurement of the Van der Pauw method

006

PC software

1. One-key automatic measurement can be realized, and the measurement can be carried out without personnel operation after the start of the test.

2. Set in the software to perform automatic temperature change measurement.

3. I-V curve and B-V curve can be performed in the software

4. The modular design in the software is convenient for customers to use and develop related functions

5. After the experimental results are measured, the data will be temporarily stored in the software. If long-term storage is required, the data can be exported to the EXCEL table to facilitate later data processing

6. Provide Hall Effect standard test samples and data from the Institute of Semiconductors of the Chinese Academy of Sciences: 1 set

007

Supporting equipment

1. Gauss meter sensor fixing bracket: all-aluminum non-conducting bracket, which can be adjusted up, down, left and right, front and back, which is convenient for users to adjust the sensor position according to their needs

2. Magnetic field sensor probe fixing device: all aluminum non-conductor bracket 5-70mm adjustable

3. Temperature measurement and control connection line fixing device

4. The corresponding tools for making ohmic contact solder joints on the sample: electric soldering iron, indium sheet, solder, enameled wire, etc.

5. 232 to USB serial line to realize the communication between the test instrument and the host computer software


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