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hot products

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    DX-100 Hall Effect Measurement System

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    DX-2012HC soft magnetic material coercivity measuring device

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    DX-330F 3D Fluxgate Magnetometer

  • Gauss Meter

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Products

Industrial Grade Wafer Magneto Optic Kerr Measuring Instrument

Using the poloidal magneto-optical Kerr effect (MOKE), the magnetic properties of wafer stacks are quickly and globally detected. Non-contact measurement avoids damage to the wafer by traditional magnetic characterization, and can be applied to sample detection before and after patterning. Up to 2.5T vertical magnetic field, which can induce the flipping of the free layer, reference layer and pinned layer of the vertical anisotropic magnetic random access memory (MRAM) film stack

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Industrial Grade Wafer Magneto Optic Kerr Measuring Instrument


Product Instruction

Using the poloidal magneto-optical Kerr effect (MOKE), the magnetic properties of wafer stacks are quickly  and globally detected. Non-contact measurement avoids damage to the wafer by traditional magnetic  characterization, and can be applied to sample detection before and after patterning. Up to 2.5T vertical  magnetic field, which can induce the flipping of the free layer, reference layer and pinned layer of the vertical  anisotropic magnetic random access memory (MRAM) film stack; Ultra-high Kerr detection sensitivity, which  can characterize the subtle magnetic changes of different film layers at the same time. Combining laser pointbypoint detection with scanning imaging can quickly create a global map of wafer magnetic properties, assisting process optimization and yield control.


Performance Indicators 

1. Sample size: supports up to 12-inch wafer testing and is backward compatible,  supports fragment testing; 

2. Magnetic field: the maximum vertical magnetic field is better than ±2.5 T, and the magnetic field resolution is 1 μT; 

3. Magnetic detection sensitivity: Kerr rotation angle detection degree is better than 0.3 mdeg (RMS), suitable for  magnetic characterization of multilayer film stacks;  

4. Sample repeat positioning accuracy: better than ±1 μm, static jitter ±0.25μm. 


Functions and Application Scenarios

1. Vertical hysteresis loop measurement of MRAM stacks and device arrays (Polar Kerr for MRAM); 

2. Vertical hysteresis loop measurement of magnetic storage media such as disks (Polar Kerr for PMR Disk); 

3. Automatic extraction of hysteresis loop information, such as free layer and pinned layer Hc, Hex, Ms, etc.; 

4. It can quickly draw the distribution map of the magnetic properties of the wafer; the system presets single point,  array, ring distribution and other scanning point modes, and supports the import of custom position lists; 

5.The system provides manual loading or fully automatic operation to meet R&D/production needs.

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Main Products
  • DX-2012HC Soft Magnetic Material Coercivity Measuring Device DX-2012HC Soft Magnetic Material Coercivity Measuring Device

    DX 2012HC soft magnetic material coercivity measuring device is mainly used for rapid measurement of soft materials including: pure iron and carbon steel, soft ferrite, magnetic powder and other regular and irregular open circuit samples, and the test method is reliable.

  • DX-100 Hall Effect Measurement System DX-100 Hall Effect Measurement System

    DX 100 Hall effect test system can be divided into normal temperature, high temperature, low temperature, high and low temperature Hall effect test system; It is used to measure the carrier concentration, mobility, resistivity, Hall coefficient, etc. of semiconductor materials; It is an essential tool for studying the electrical properties of semiconductor materials.

  • DX-9000 Series Vibration Sample Magnetometer DX-9000 Series Vibration Sample Magnetometer

    DX-9000 series vibrating sample magnetometer is a kind of magnetometer developed by Xiamen Dexing Magnet Tech. Co., Ltd. The main research and development of the magnetic material measurement system is a new generation of products based on the electromagnet platform.

  • DX-2100AM Magnetization Angle Measurement System DX-2100AM Magnetization Angle Measurement System

    The DX 2100AM magnetization angle measurement system is connected to the independent three component fluxmeter by a three dimensional Helmholtz coil to form a hardware test part;Through a microcomputer conversion of the test data of three components, a complete magnetization angle measurement system is formed.