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Multifunctional Magneto Optic Kerr Microscopic Imaging System
Kerr microscope has a set of methods to characterize almost all magnetic intrinsic parameters. Compared with other characterization methods, the biggest advantage is that it can be used to characterize the local properties in a small area (220 nm), which provides the possibility for various magnetic control experiments (such as irradiation, voltage control, optical magnetic control) and the characterization of materials with uneven properties.
contact nowMultifunctional Magneto Optic Kerr Microscopic Imaging System
1.1 Test the quality of magnetic material
1.2 Detect defect position
Typical applications: Characterization of local magnetic intrinsic parameters
Kerr microscope has a set of methods to characterize almost all magnetic intrinsic parameters. Compared with other characterization methods, the biggest advantage is that it can be used to characterize the local properties in a small area (220 nm), which provides the possibility for various magnetic control experiments (such as irradiation, voltage control, optical magnetic control) and the characterization of materials with uneven properties.
1. Characterization of local saturation magnetization Ms
2. Characterization of local anisotropic energy K
3 Heisenberg exchange interaction constant Aex
4. Characterization of Dzyaloshinskii-Moriya interaction (DMI)
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DX-2012HC Soft Magnetic Material Coercivity Measuring Device
DX 2012HC soft magnetic material coercivity measuring device is mainly used for rapid measurement of soft materials including: pure iron and carbon steel, soft ferrite, magnetic powder and other regular and irregular open circuit samples, and the test method is reliable.
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DX-100 Hall Effect Measurement System
DX 100 Hall effect test system can be divided into normal temperature, high temperature, low temperature, high and low temperature Hall effect test system; It is used to measure the carrier concentration, mobility, resistivity, Hall coefficient, etc. of semiconductor materials; It is an essential tool for studying the electrical properties of semiconductor materials.
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DX-9000 Series Vibration Sample Magnetometer
DX-9000 series vibrating sample magnetometer is a kind of magnetometer developed by Xiamen Dexing Magnet Tech. Co., Ltd. The main research and development of the magnetic material measurement system is a new generation of products based on the electromagnet platform.
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DX-2100AM Magnetization Angle Measurement System
The DX 2100AM magnetization angle measurement system is connected to the independent three component fluxmeter by a three dimensional Helmholtz coil to form a hardware test part;Through a microcomputer conversion of the test data of three components, a complete magnetization angle measurement system is formed.