Magnetic Field Probe Station Series

Magnetic Field Probe Station Series

Production Instruction

The magnetic field probe station is mainly used for testing the  electrical and magnetic characteristics of semiconductor  materials, micro-nano devices, magnetic materials, spintronic  devices and related technical fields. It can provide a magnetic  field or variable temperature environment, and perform high  precision DC/RF measurements. The company's products design  and produce various magnetic field probe stations with strong  stability, diverse functions, and upgrade ableexpansion. They are  suitable for experimental research and production in universities,  research institutes, and the semiconductor industry.

1. One-dimensional In-plane Magnetic Field Probe Station--PS1D-MS

Technical Parameters

2. One-Dimensional Vertical Magnetic Field Probe Station--PS1D-MS

Product Features 

1 Magnetic field direction: Vertical 

2 Sample Size： 20mm*20mm (upgradable to 4-inch wafer test) 

3 Whether the air gap is adjustable：Upper yoke can be removed 

4 Air gap size：7 mm 

5 Type and number of probes：DC Probe (4 sets)/Microwave Probe (4 sets) 

6 Sample displacement table parameters： XY-axis travel ± 15 mm, horizontal displacement adjustment accuracy 1 μm, T-axis ±5° fine adjustment. 

7 Microscope type：Monocular microscope 

8 Magnetic field direction and maximum magnetic field strength ： 

1. Vertical magnetic field (Z) 

2. ≥1200 mT

Product Briefing 

1 A one-dimensional magnetic field probe table providing a vertical magnetic field with ± 1% magnetic field uniformity @ φ2 mm. 

2 Real-time monitoring feedback of magnetic field strength, with monitoring accuracy better than 1 % and magnetic field resolution better than 0.02 mT. 

3 A perpendicular magnet with a movable permeable yoke to facilitate microscopic observation during lancing. 

4 Can meet 4 groups of DC probes used for simultaneous testing, microwave probes can be placed in 4 groups. 

5 Upgrade points available for equipment 

a. Upgrading of the sample multi-axis test displacement table to semi-automatic. 

b. Rapid lift function of the probe plane. 

c. Upgradeable to a 4-inch wafer magnetic field probe stage.

3. Two-dimensional Magnetic Field Probe Station--PS2DY-MS

Product Features 

1 Magnetic field direction：X, Z 

2 Sample Size：40mm*40mm (maximum) 

3 Whether the air gap is adjustable： No 

4 Magnetic pole air gap： 40 mm / 25 mm / 12 mm available 

5 Type and number of probes： Supports up to 7 groups of probes placed simultaneously. 

6 DC probes (3 sets) + microwave probes (4 sets) 

7 Sample displacement table parameters XY axis displacement travel ± 12.5 mm, displacement adjustment accuracy 1 μm; T axis rotation ±5° 

8 Microscope type： Stereo microscope/monocular microscope 

9 Magnetic field direction and maximum magnetic field strength 

a. In-plane magnetic field (X)： ≥800 mT@12 mm 

b. Vertical magnetic field (Z)： ≥140 mT 

c. The vertical component of the magnetic field is better than 0.025 % when the magnetic field in the surface is applied alone

Product Briefing

1 A two-dimensional magnetic field probe table containing two sets of magnets to provide both perpendicular and in-plane magnetic fields with a magnetic field uniformity of ±1% @ φ1 mm. 

2 Real-time monitoring feedback of magnetic field strength, with monitoring accuracy better than 1 % and magnetic field resolution better than 0.02 mT. 

3 In-plane magnet head spacing can be adjusted according to sample size to obtain maximum magnetic field, with high compatibility.

4 Compatible with up to 7 groups of probes for simultaneous use (4 microwave, 3 DC). 

5 Y-axis provides a large stroke displacement device for rapid sample change by pulling without moving the probe. 

6 Equipped with a sample stage tilt fine adjustment knob to ensure that the sample plane is parallel to the in-plane magnetic field direction. 

7 Upgrade points available for equipment 

a. Upgrading of the sample multi-axis test displacement table to semi-automatic. 

b. Add the function of rapid lifting of the probe plane to facilitate multi-point repeat measurement.