products categories

Download

Download Download file and products catalogue for equipment.

contact us

  • If you have questions, please contact us, all questions will be answered
  • Tel : 18030236818
  • Fax : +86-592 5237901
  • Email : dexing@china-dexing.com

hot products

  • Hall Effect Measurement System

    DX-100 Hall Effect Measurement System

  • soft magnetic material coercivity measuring device

    DX-2012HC soft magnetic material coercivity measuring device

  • Fluxgate Magnetometer

    DX-330F 3D Fluxgate Magnetometer

  • Gauss Meter

    DX-180 Gauss Meter

  • Double-Yoke Double-Tuning Adjustable Air Gap Electromagnet

    DXSB Double-Yoke Double-Tuning Adjustable Air Gap Electromagnet

  • 3 Axis Helmholtz Coils

    3 Axis Helmholtz Coils

Products

One-dimensional Transverse Probe

The gallium arsenide Transverse Hall Probe is usually rectangular and the test area is one millimeter at the front end; It is mainly suitable for space magnetic field, surface magnetic measurement or alternating pulse magnetic field measurement; can also be customized in special areas of magnetic field measurement probes, such as high temperature, low temperature or high frequency.

contact now

One-dimensional Transverse Probe


One-dimensional Transverse Probe:

Probe length can be customized;

Array probe can be customized

Can add temperature sensor inside the probe  Active area


Model

L(cm)

approx

T

(mm)

max

W

(mm)

A

(mm)

Active area

(mm)

Frequency range

Full Scale

(Standard)

Magnetic linearity

(%rdg)

Operating temp range

Zero Field Temp coefficient

(max)

Temp coefficient

(max)

Encapsulation material
CDX800F6/8/1012.61±0.10.15DC-50kHz30kG±0.50% - 20kG -10℃ ~ +75℃±0.11 G/℃±0.015%/℃Brass
CDX801F6/8/100.82.21±0.10.15DC-50kHz30kG±0.50% - 20kG -10℃ ~ +75℃±0.11 G/℃±0.015%/℃Brass 
CDX802F6/8/100.61.71±0.10.15DC-50kHz30kG±0.50% - 20kG -10℃ ~ +75℃±0.11 G/℃±0.015%/℃Brass  
MDX801F6/8/100.51.61±0.10.15DC-50kHz30kG±0.50% - 20kG -10℃ ~ +75℃±0.11 G/℃±0.015%/℃ Brass 
MDX802F6/8/100.51.21±0.10.15DC-50kHz30kG±0.50% - 20kG -10℃ ~ +75℃±0.11 G/℃±0.015%/℃ Brass  

MDX803F

(Flexible)

6/8/100.351.2/0.80.2±0.050.15DC-50kHz30kG±0.50% - 20kG -10℃ ~ +75℃±0.11 G/℃±0.015%/℃Polytesin 

MMDX804F

(Flexible)

6/8/100.25  1.2/0.80.2±0.050.1DC-50kHz30kG±0.50% - 20kG -10℃ ~ +75℃±0.11 G/℃±0.015%/℃ Polytesin  


High-precision one-dimensional transverse probe:

Probe length can be customized;

Array probe can be customized

Can add temperature sensor inside the probe  Active area

Suitable for DX-150 and DX-160 gauss meters 


Model

L(cm)

approx

T(mm)
max

W

(mm)

A

(mm)

Active area

(mm)

Frequency range

Full Scale

(Standard)

Magnetic linearity

(%rdg)

Operating temp range

Zero Field Temp coefficient

(max)

Temp coefficient

(max)

Encapsulation material
MCDX800F6/8/1012.61±0.10.15DC-50kHz30kG ±0.2% ~ 30kG -10℃ ~ +75℃±0.08 G/℃ ±0.015%/℃Brass
MCDX801F6/8/100.82.21±0.10.15DC-50kHz30kG±0.2% ~ 30kG -10℃ ~ +75℃±0.08 G/℃ ±0.015%/℃ Brass 
MCDX802F6/8/100.61.71±0.10.15DC-50kHz30kG±0.2% ~ 30kG -10℃ ~ +75℃±0.08 G/℃ ±0.015%/℃ Brass  
MMDX801F6/8/100.51.61±0.10.15DC-50kHz30kG±0.2% ~ 30kG -10℃ ~ +75℃±0.08 G/℃ ±0.015%/℃ Brass  
MMDX802F6/8/100.51.21±0.10.15DC-50kHz30kG±0.2% ~ 30kG -10℃ ~ +75℃±0.08 G/℃ ±0.015%/℃Brass  

MMDX803F

(Flexible)

6/8/100.351.2/0.80.2±0.050.15DC-50kHz30kG±0.2% ~ 30kG -10℃ ~ +75℃±0.08 G/℃ ±0.015%/℃ Polytesin 

MMDX804F

(Flexible)

6/8/100.25  1.2/0.80.2±0.050.1DC-50kHz30kG±0.2% ~ 30kG -10℃ ~ +75℃±0.08 G/℃ ±0.015%/℃Polytesin


Ultra-high precision one-dimensional transverse probe:

Probe length can be customized;

Array probe can be customized

Can add temperature sensor inside the probe  Active area

Suitable for dx-180, dx-210, dx-360 gauss meters


Model

L(cm)

approx

T(mm)
max

W

(mm)

A

(mm)

Active area

(mm)

Frequency range

Full Scale

(Standard)

Magnetic linearity

(%rdg)

Operating temp range

Zero Field Temp coefficient

(max)

Temp coefficient

(max)

Encapsulation material
HCDX800F6/8/1012.61±0.10.15DC-1000kHz300kG±0.05% ~ 30kG -10℃ ~ +100℃±0.06 G/℃ ±0.007%/℃Brass
HCDX801F6/8/100.82.21±0.10.15DC-1000kHz300kG±0.05% ~ 30kG -10℃ ~ +100℃±0.06 G/℃ ±0.007%/℃Brass
HCDX802F6/8/100.61.71±0.10.15DC-1000kHz300kG±0.05% ~ 30kG -10℃ ~ +100℃±0.06 G/℃ ±0.007%/℃Brass
HMDX801F6/8/100.51.61±0.10.15DC-1000kHz300kG±0.05% ~ 30kG -10℃ ~ +100℃±0.06 G/℃ ±0.007%/℃Brass
HMDX802F6/8/100.51.21±0.10.15DC-1000kHz300kG±0.05% ~ 30kG -10℃ ~ +100℃±0.06 G/℃ ±0.007%/℃Brass

HMDX803F

(Flexible)

6/8/100.351.2/0.80.2±0.050.15DC-1000kHz300kG±0.2% ~ 30kG -10℃ ~ +100℃±0.08 G/℃ ±0.007%/℃Polytesin

HMDX804F

(Flexible)

6/8/100.25  1.2/0.80.2±0.050.1DC-1000kHz300kG±0.5% ~ 30kG -10℃ ~ +100℃±0.08 G/℃ ±0.007%/℃Polytesin


Flexible high-precision one-dimensional transverse probe (suitable for special environment or high frequency) :

Model

L(cm)

approx

T(mm)
max

W

(mm)

A

(mm)

Active area

(mm)

Frequency range

Full Scale

(Standard)

Magnetic linearity

(%rdg)

Operating temp range

Zero Field Temp coefficient

(max)

Temp coefficient

(max)

Encapsulation material
MCDX800F-R6/8/101.52.41±0.10.15DC-100kHz30kG±0.2% ~ 30kG-10℃ ~ +100℃±0.08 G/℃±0.015%/℃Plastic
MCDX801F-R6/8/1012.61±0.10.15DC-100kHz30kG±0.2% ~ 30kG -10℃ ~ +100℃±0.08 G/℃±0.015%/℃Plastic
MCDX802F-R6/8/100.82.21±0.10.15DC-100kHz30kG±0.2% ~ 30kG -10℃ ~ +100℃±0.08 G/℃±0.015%/℃Plastic
MCDX803F-R6/8/100.51.61±0.10.15DC-100kHz30kG±0.2% ~ 30kG -10℃ ~ +100℃±0.08 G/℃±0.015%/℃Plastic


High-precision temperature compensation one-dimensional transverse hall probe (with temperature sensor) :

Model

L(cm)

approx

T(mm)
max

W

(mm)

A

(mm)

Active area

(mm)

Frequency range

Full Scale

(Standard)

Magnetic linearity

(%rdg)

Operating temp range

Zero Field Temp coefficient

(max)

Temp coefficient

(max)

Encapsulation material
MCDX800F-T6/8/1012.61±0.10.15DC-100kHz30kG±0.2% ~ 30kG -10℃ ~ +100℃±0.08G/℃±0.01%/℃Brass
MCDX801F-T6/8/100.82.21±0.10.15DC-100kHz30kG±0.2% ~ 30kG-10℃ ~ +100℃±0.08 G/℃±0.01%/℃Brass
HCDX800F-T6/8/1012.61±0.10.15DC-100kHz30kG±0.05% ~ 30kG -10℃ ~ +100℃±0.08G/℃±0.01%/℃Brass
HCDX801F-T6/8/100.82.21±0.10.15DC-100kHz30kG±0.05% ~ 30kG -10℃ ~ +100℃±0.08 G/℃±0.01%/℃Brass


High precision and high magnetic field one-dimensional transverse hall probe:

Model

L(cm)

approx

T

(mm)

max

W

(mm)

A

(mm)

Active area

(mm)

Frequency range

Full Scale

(Standard)

Magnetic linearity(%rdg)

Operating temp range

Zero Field Temp coefficient

(max)

Temp coefficient

(max)

Encapsulation material

HCDX

800F-H

6/8/1012.61±0.10.15DC-100kHz300kG±0.05% ~ 30kG
±0.8% ~ 50kG
±1.5% ~ 100kG
±5% ~ 300kG
-10℃ ~ +100℃±0.08G/℃±0.01%/℃Brass

HCDX

801F-H

6/8/100.82.21±0.10.15DC-100kHz300kG±0.05% ~ 30kG
±0.8% ~ 50kG
±1.5% ~ 100kG
±5% ~ 300kG
-10℃ ~ +100℃±0.08 G/℃±0.01%/℃Brass


High precision low magnetic field one-dimensional transverse hall probe:

Model

L(cm)

approx

T(mm)   maxW
(mm)
A
(mm)
Accuracy

Full Scale

(Standard)

Magnetic linearity(%rdg)Operating  temp rangeZero Field Temp coefficient(max)

Temp coefficient

(max)

Encapsulation material
LDX801F4.5/72.8102±0.10.1uT300uT±0.2% - 100uT
±0.4% - 300uT
-10℃ ~ +75℃±0.08 G/℃ ±0.05%/℃Fiber
LDX802F4.5/72.3102±0.10.01uT600uT±0.2% - 100uT
±0.4% - 300uT
-10℃ ~ +75℃±0.08 G/℃ ±0.015%/℃Fiber
LDX803F4.5/73111±0.10.01uT600uT±0.2% - 100uT
±0.4% - 300uT
-10℃ ~ +75℃±0.08 G/℃  ±0.015%/℃Fiber


High-precision high-temperature resistance temperature compensation one-dimensional transverse hall probe:

Model

L(cm)

approx

T

(mm) max

W

(mm)

A

(mm)

Active area

(mm)

Frequency range

Full Scale

(Standard)

Magnetic linearity

(%rdg)

Operating temp rangeZero Field Temp coefficient(max)

Temp coefficient

(max)

Encapsulation material
CDX800F-HT6/8/1012.61±0.10.15DC-50kHz30kG ±0.2% ~ 30kG-10℃ ~ +195℃±0.08 G/℃±0.007%/℃Brass
CDX801F-HT6/8/100.82.21±0.10.15DC-50kHz30kG±0.2% ~ 30kG-10℃ ~ +195℃±0.08 G/℃±0.007%/℃Brass
CDX802F-HT6/8/100.61.71±0.10.15DC-50kHz30kG±0.2% ~ 30kG-10℃ ~ +195℃±0.08 G/℃±0.007%/℃Brass
MDX801F-HT6/8/100.51.61±0.10.15DC-50kHz30kG±0.2% ~ 30kG-10℃ ~ +195℃±0.08 G/℃±0.007%/℃Brass
MDX802F-HT6/8/100.51.21±0.10.15DC-50kHz30kG±0.2% ~ 30kG-10℃ ~ +195℃±0.08 G/℃±0.007%/℃Brass
MDX803F-HT6/8/100.351.2/0.80.2±0.050.15DC-50kHz30kG±0.2% ~ 30kG-10℃ ~ +195℃±0.08 G/℃±0.015%/℃Polyresin


High-precision low-temperature resistance temperature compensation one-dimensional transverse hall probe:

Model

L(cm)

approx

T

(mm) max

W

(mm)

A

(mm)

Active area

(mm)

Frequency range

Full Scale

(Standard)

Magnetic linearity

(%rdg)

Operating temp rangeZero Field Temp coefficient(max)

Temp coefficient

(max)

Encapsulation material
MCDX800F-LT6/8/1012.61±0.10.15DC-30kHz30kG±0.2% ~ 20kG -269℃ ~ +75℃±0.08 G/℃ ±0.007%/℃Brass
MCDX801F-LT6/8/100.82.21±0.10.15DC-30kHz30kG±0.2% ~ 20kG -269℃ ~ +75℃±0.08 G/℃ ±0.007%/℃Brass
MMDX801F-LT6/8/100.51.61±0.10.15DC-30kHz30kG±0.2% ~ 20kG -269℃ ~ +75℃±0.08 G/℃ ±0.007%/℃Brass
MMDX802F-LT6/8/100.51.21±0.10.15DC-30kHz30kG±0.2% ~ 20kG -269℃ ~ +75℃±0.08 G/℃ ±0.007%/℃Brass


High-precision high and low-temperature resistance temperature compensation one-dimensional transverse hall probe:

Model

L(cm)

approx

T

(mm) max

W

(mm)

A

(mm)

Active area

(mm)

Frequency range

Full Scale

(Standard)

Magnetic linearity

(%rdg)

Operating temp rangeZero Field Temp coefficient(max)

Temp coefficient

(max)

Encapsulation material
HCDX800F-HL6/8/1012.61±0.10.15DC-30kHz30kG±0.05% ~ 20kG -269℃ ~ +200℃±0.08 G/℃ ±0.007%/℃Brass
HCDX801F-HL6/8/100.82.21±0.10.15DC-30kHz30kG±0.05% ~ 20kG-269℃ ~ +200℃±0.08 G/℃ ±0.007%/℃Brass
HMDX801F-HL6/8/100.51.61±0.10.15DC-30kHz30kG±0.05% ~ 20kG-269℃ ~ +200℃±0.08 G/℃ ±0.007%/℃Brass
HMDX802F-HL6/8/100.51.21±0.10.15DC-30kHz30kG±0.05% ~ 20kG-269℃ ~ +200℃±0.08 G/℃ ±0.007%/℃Brass


Ultra High precision low-temperature resistance temperature compensation one-dimensional transverse hall probe:

Model

L(cm)

approx

T

(mm) max

W

(mm)

A

(mm)

Active area

(mm)

Frequency range

Full Scale

(Standard)

Magnetic linearity

(%rdg)

Operating temp rangeZero Field Temp coefficient(max)

Temp coefficient

(max)

Encapsulation material
HCDX800F-LT6/8/1012.61±0.10.15DC-30kHz30kG±0.05% ~ 20kG -269℃ ~ +75℃±0.08 G/℃±0.007%/℃Brass
HCDX801F-LT6/8/100.82.21±0.10.15DC-30kHz30kG±0.05% ~ 20kG-269℃ ~ +75℃±0.08 G/℃±0.007%/℃Brass
HMDX801F-LT6/8/100.51.61±0.10.15DC-30kHz30kG±0.05% ~ 20kG-269℃ ~ +75℃±0.08 G/℃±0.007%/℃Brass
HMDX802F-LT6/8/100.51.21±0.10.15DC-30kHz30kG±0.05% ~ 20kG-269℃ ~ +75℃±0.08 G/℃±0.007%/℃Brass


OEM Mirco Transverse Probes:

hall-probe

Probe length can be customized;

Array probe can be customized

Can add temperature sensor inside the probe  Active area

Delivery time is 1-4 weeks


Model

L

(cm) approx

T

(mm) max

W
(mm)

A

(mm)

Active area

(mm)

Frequency rangeMagnetic sensitivity

Magnetic linearity

(%rdg)

Operating temp range

Unbalanced voltage

(mv)

Temp coefficient

(max)

Encapsulation material
CDX801A5.5/80.7821±0.10.15DC-100KHZ2.5mV/KG to 15mV/KG

<±0.2%

to

30kG

-20°C to

+75°C

≤±0.10-0.03%/C° Brass
CDX801B5.5/80.78 21±0.10.15 DC-100KHZ2.5mV/KG to 15mV/KG

<±0.3%

to

30kG

 -20°C to

+75°C

≤±0.20-0.03%/C° Brass
CDX802A5.5/80.621.51±0.1 0.15DC-100KHZ2.5mV/kG to 15mV/kG

<±0.2%

to

30kG

-20°C to

+75°C

≤±0.10-0.03%/C°  Brass 
CDX802B5.5/80.621.51±0.10.15DC-100KHZ2.5mV/kG to 15mV/kG

<±0.3%

to

30kG

-20°C to

+75°C

≤±0.20
 Brass
-0.03%/C°
MDX801A5.5/80.51.681±0.10.15DC-100KHZ2.5mV/KG to 15mV/KG

<±0.2%

to

30kG

 -20°C to

+75°C

≤±0.10-0.03%/C°  Brass
MDX801B5.5/80.51.681±0.10.15DC-100KHZ2.5mV/KG to 15mV/KG <±0.3%

 -20°C to

+75°C

≤±0.20-0.03%/C° Brass
to
30kG
MDX802A
(Flexible)
5.5/80.350.70.5±0.050.15DC-100KHZ2.5mV/kG to 15mV/kG

<±0.2%

to

30kG

-20°C to

+75°C

≤±0.10-0.03%/C°Polyresin
MDX802B
(Flexible)
5.5/80.350.70.5±0.050.15DC-100KHZ2.5mV/kG to 15mV/kG

<±0.3%

to

30kG

-20°C to

+75°C

≤±0.20-0.03%/C°Polyresin


inquiry now

We will give you a quotation within 24 hours.



Main Products
  • DX-2012HC Soft Magnetic Material Coercivity Measuring Device DX-2012HC Soft Magnetic Material Coercivity Measuring Device

    DX 2012HC soft magnetic material coercivity measuring device is mainly used for rapid measurement of soft materials including: pure iron and carbon steel, soft ferrite, magnetic powder and other regular and irregular open circuit samples, and the test method is reliable.

  • DX-100 Hall Effect Measurement System DX-100 Hall Effect Measurement System

    DX 100 Hall effect test system can be divided into normal temperature, high temperature, low temperature, high and low temperature Hall effect test system; It is used to measure the carrier concentration, mobility, resistivity, Hall coefficient, etc. of semiconductor materials; It is an essential tool for studying the electrical properties of semiconductor materials.

  • DX-9000 Series Vibration Sample Magnetometer DX-9000 Series Vibration Sample Magnetometer

    DX-9000 series vibrating sample magnetometer is a kind of magnetometer developed by Xiamen Dexing Magnet Tech. Co., Ltd. The main research and development of the magnetic material measurement system is a new generation of products based on the electromagnet platform.

  • DX-2100AM Magnetization Angle Measurement System DX-2100AM Magnetization Angle Measurement System

    The DX 2100AM magnetization angle measurement system is connected to the independent three component fluxmeter by a three dimensional Helmholtz coil to form a hardware test part;Through a microcomputer conversion of the test data of three components, a complete magnetization angle measurement system is formed.