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hot products

  • Hall Effect Measurement System

    DX-100 Hall Effect Measurement System

  • soft magnetic material coercivity measuring device

    DX-2012HC soft magnetic material coercivity measuring device

  • Fluxgate Magnetometer

    DX-330F 3D Fluxgate Magnetometer

  • Gauss Meter

    DX-180 Gauss Meter

  • Double-Yoke Double-Tuning Adjustable Air Gap Electromagnet

    DXSB Double-Yoke Double-Tuning Adjustable Air Gap Electromagnet

  • 3 Axis Helmholtz Coils

    3 Axis Helmholtz Coils

Products

DX-50 Hall Effect Measurement System

DX 50 Hall Effect Measurement System is an essential tool to understand and study of semiconductor devices and electrical properties of semiconductor materials. It will get Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient, Magneto resistance, I V curve and I-R curve measurement parameters

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DX-50 Hall Effect Measurement System


Testable materials:

  1. Semiconductor materials: SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe and ferrite materials etc.

  2. Low impedance material: metal, transparent oxide, weak magnetic semiconductor materials, TMR material, ect.

  3. High impedance material: Semi-insulating GaAs, GaN, CdTe, etc.


Hall-effect system components: 

This system is consisted of electromagnet, high-precision electromagnet power supply, high-precision constant current source, high-precision voltage meter, gauss meter, connecting cables, standard sample, sample mount and the system software. The system contains specially developed DX-320 constant current source, six semi-microvolt meter and complex switching relays for Hall measurements (Integrally assembled switch). These have greatly simplified the connection and operation of experimental. DX-320 can be used alone as a constant current source or micro-volt meter. The system can be used to measure the carrier concentration, mobility, resistivity, Hall coefficient, and other important parameters of semiconductor material. These parameters must be known in advance to understand the electrical properties of semiconductor materials, so Hall Effect measurement system is an essential tool to understand and study of semiconductor devices and electrical properties of semiconductor materials. The results can be calculated by the software automatically, at the same time, it will get Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient, Magneto resistance, I-V curve and I-R curve measurement parameters.

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Main technical indicators:


1) Magnetic field intensity: Greater than 7000 gauss (DX-50)
Greater than 14000 gauss (DX-100)  Magnetic gap 15mm
2) Electric current: 0.1mA~50mA(Expandable to 1A)
3) Measuring voltage: 0.1uV~30V
4) Offers a variety of standard test materials: GaAs, Si etc.
5) Magnetic field minimum resolution: 0.01mT
6) Magnetic field measuring range: 0~3T
7) Resistance Range: 10mΩ~1MΩ
8) Carrier concentration: 103~1022cm-3
9) Mobility: 0.1~108cm2/volt*sec
10) Systematic measurement errors:<2%


▲ with Gauss meter or data acquisition board computer communications
▲ I-V curves and I-R curve measurements
▲ resistivity range :10-6 ~ 1011 Ohm * cm
▲ Resistance Range: 10 m Ohms ~ 1MOhms
▲ carrier concentration: 103 ~ 1022scm-3
▲ mobility: 102 ~ 107 cm2/volt * sec
▲ fully automated testing, a key processing




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Main Products
  • DX-2012HC Soft Magnetic Material Coercivity Measuring Device DX-2012HC Soft Magnetic Material Coercivity Measuring Device

    DX 2012HC soft magnetic material coercivity measuring device is mainly used for rapid measurement of soft materials including: pure iron and carbon steel, soft ferrite, magnetic powder and other regular and irregular open circuit samples, and the test method is reliable.

  • DX-100 Hall Effect Measurement System DX-100 Hall Effect Measurement System

    DX 100 Hall effect test system can be divided into normal temperature, high temperature, low temperature, high and low temperature Hall effect test system; It is used to measure the carrier concentration, mobility, resistivity, Hall coefficient, etc. of semiconductor materials; It is an essential tool for studying the electrical properties of semiconductor materials.

  • DX-9000 Series Vibration Sample Magnetometer DX-9000 Series Vibration Sample Magnetometer

    DX-9000 series vibrating sample magnetometer is a kind of magnetometer developed by Xiamen Dexing Magnet Tech. Co., Ltd. The main research and development of the magnetic material measurement system is a new generation of products based on the electromagnet platform.

  • DX-2100AM Magnetization Angle Measurement System DX-2100AM Magnetization Angle Measurement System

    The DX 2100AM magnetization angle measurement system is connected to the independent three component fluxmeter by a three dimensional Helmholtz coil to form a hardware test part;Through a microcomputer conversion of the test data of three components, a complete magnetization angle measurement system is formed.