Magneto-optic Kerr Effect System
The magneto-optical Kerr effect measurement system is an ideal measurement tool for studying magnetic films and magnetic microstructure. Rotational magneto-optical Kerr effect (RotMOKE) is an experimental method similar to torque measurement of anisotropy on the basis of magneto-optical Kerr effect measurement, which can quantitatively obtain the magnetic anisotropy value of the sample, and combine the source table to measure the magnetic transport performance of the sample.
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Magneto-optic Kerr Effect measure System
The surface magneto--optic Kerr effect (SMOKE) system offered by Dexing Magnet is a high - sensitivity magnetometer. The hysteresis loop of the sample can be obtained by detecting the change of reflection intensity on the surface of the magnetic sample, and the Kerr angle and ellipsometry of the sample can be calculated by the hysteresis loop.
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Micro Magneto Optic Kerranalyzing Instrument
The magneto-optical Kerr effect can be used to measure hysteresis lines with high speed, high accuracy, non-contact and non-destructive (no additional operations such as processing or slicing of the sample), and to obtain information on the coercivity, relative magnetization strength and magnetic anisotropy of magnetic materials.
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Moke Hysteresis Loop Measuring Instrument
Hich-precision characterization of the maanetism of ferromacnetism, artificial antiferromaanetism, two-dimensional materials and microelectronic devices using the maneto-optical Kerr effect, The in-plane and vertical magnetic fields can be applied atthe same time, and the in-plane macnetization component and the vertical magnetization component can be scanned simultaneously
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Industrial Grade Wafer Magneto Optic Kerr Measuring Instrument
Using the poloidal magneto-optical Kerr effect (MOKE), the magnetic properties of wafer stacks are quickly and globally detected. Non-contact measurement avoids damage to the wafer by traditional magnetic characterization, and can be applied to sample detection before and after patterning. Up to 2.5T vertical magnetic field, which can induce the flipping of the free layer, reference layer and pinned layer of the vertical anisotropic magnetic random access memory (MRAM) film stack
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Multifunctional Magneto Optic Kerr Microscopic Imaging System
Kerr microscope has a set of methods to characterize almost all magnetic intrinsic parameters. Compared with other
characterization methods, the biggest advantage is that it can be used to characterize the local properties in a small area
(220 nm), which provides the possibility for various magnetic control experiments (such as irradiation, voltage control,
optical magnetic control) and the characterization of materials with uneven properties.
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Magnetic Field Probe Station Series
The magnetic field probe station is mainly used for testing the electrical and magnetic characteristics of semiconductor materials, micro-nano devices, magnetic materials, spintronic devices and related technical fields. It can provide a magnetic field or variable temperature environment, and perform high precision DC/RF measurements.
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